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ZEISS Is Introducing a New Integrated System for Serial Block-Face Imaging

The newly introduced ZEISS Volutome is an in-chamber ultramicrotome for ZEISS field emission scanning electron microscopes (FE-SEM). It is designed to…

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This article was originally published by AITHORITY
ZEISS is introducing a new integrated system for serial block-face imaging

The newly introduced ZEISS Volutome is an in-chamber ultramicrotome for ZEISS field emission scanning electron microscopes (FE-SEM). It is designed to image the ultrastructure of biological, resin-embedded samples in 3D in life sciences.

Scanning electron microscopy (SEM) in general can be used to explore intricate, ultrastructural 3D information with various methods collectively known as volume EM (vEM). Serial block-face SEM (SBF-SEM) is the vEM technology of choice for researchers who prefer easy sample preparation in combination with a highly automated imaging process enabling the acquisition of large volume datasets.

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ZEISS Volutome is an end-to-end solution for serial block-face imaging from hardware to software including image processing, segmentation, and visualization. The ultramicrotome can be easily replaced by a conventional SEM stage, converting the 3D FE-SEM into a standard FE-SEM, making the system adaptable to a multi-purpose environment.

Saving time with automated cutting, image acquisition, and pre-processing

Imaging of biological structures with high resolution in large volumes can last for days. Therefore, SBF-SEM requires stable acquisition conditions over a long period of time. ZEISS Volutome allows highly automated and unattended cutting and imaging. During image acquisition, images are simultaneously pre-calculated for stitching and z-stack alignment. Results are at the user’s fingertips in one click.

3D imaging in every way

ZEISS Volutome comes with the new high-speed, high-sensitivity detector that is specially designed for serial block-face imaging: ZEISS Volume BSD enables high-contrast images even at low acceleration voltages. In combination with the ZEISS patented Focal Charge Compensation, charge-prone samples can be easily imaged without compromises by charge neutralization at the block face. Furthermore, the built-in ZEISS Volutome stage facilitates the acquisition of large volume EM datasets.

Applications

Serial block-face imaging with ZEISS Volutome can be used to study cellular structures in any biological sample that has been prepared for electron microscopy. Neuroscience, cell biology and plant science are prominent research fields to mention or imaging of tissues in general.

From basic research in developmental, cellular, or molecular neuroscience to applied research in aging or neurodegenerative diseases, researchers across many neuroscience disciplines continue to pursue better understanding of neuronal connections and signaling pathways with serial block-face SEM.

In cell biology, high resolution imaging is necessary to visualize the ultrastructure of cells and cellular components, analyze morphology, and quantify structures of interest.

Serial block-face SEM reveals ultrastructural changes in plants induced by genetic mutations or suffering from drought, climate change or pollution. These factors translate into health and disease states in plants which impact crop yield, food production and, ultimately, human wellbeing.

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Whether researchers work with tumors and biopsies, organ or tissue sections, organoids, embryos of model organisms and more, serial block-face imaging allows large sample tissue volumes to be imaged and analyzed within a broader 3D context.

One contact for serial block-face imaging

With years of experience in vEM involving serial block-facing imaging, ZEISS offers an end-to-end solution from hardware to software. ZEISS Volutome is based on the basic research technology of the Max-Planck Institute for Neurobiology in Martinsried, Germany. ZEISS is in close contact with the research community to provide solutions that are tailored to the users’ needs.

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[To share your insights with us, please write to sghosh@martechseries.com]

The post ZEISS Is Introducing a New Integrated System for Serial Block-Face Imaging appeared first on AiThority.



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